- MID
- 3755607
High Resolution Telecentric Lens TLW110 - 0.8X-1.1"
Request For Quotation
■Provides clear 2D images by removing unnecessary images due to sample steps or perspective
■No change in magnification within DOF
■Inspection possible regardless of field height & angle
■Various configurations including ST, HR, Long WD, and Large Format Type
■Image optical system for precision measurement, alignment, surface inspection, etc. of semiconductor wafers
■No change in magnification within DOF
■Inspection possible regardless of field height & angle
■Various configurations including ST, HR, Long WD, and Large Format Type
■Image optical system for precision measurement, alignment, surface inspection, etc. of semiconductor wafers
- Certification
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- Award
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- Shipping
-
- Lead Time1 ~ 60days
- Type of Freight MM
- Modes of Transport Proceed after consultation
- Products Shipped From Cheongju
- Payment
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- Quantity
- MOQ : 1 EA
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