Specification Details
Product Name Fluorescent Microscope System
Brand LEESOS
Product Type Image Optical System
Main Fields Bio, Semiconductor, LED/OLED
Sample Type LED/OLED Organic Chemical Samples
Fluorescent Sample Support Fluorescent Material-Coated Samples
Imaging Function Fluorescent Sample Imaging
Position Detection Detection of Positional Information from Fluorescent Sample Images
Illumination Special Wavelength + VIS Wavelength
Irradiation Method Simultaneous Irradiation
Optical Functions Imaging, Alignment, Surface Inspection
System Configuration Various Format Types Available
Inspection Applications Bio & Semiconductor Sample Inspection
Additional Application LED/OLED Organic Chemical Sample Inspection
Special Feature Simultaneous Special Wavelength + VIS Wavelength Irradiation
Patent Status Simultaneous Irradiation Technology Stated as Patented in Provided Information

 

 

Key Product Features

Fluorescent Sample Imaging

The system is configured for imaging fluorescent material-coated samples. It can detect positional information from the acquired fluorescent sample image, supporting inspection processes where the location of fluorescent areas must be identified.

Special Wavelength + VIS Simultaneous Irradiation

A key feature is the ability to provide simultaneous irradiation using a special wavelength and VIS wavelength. This configuration supports optical observation of samples under different illumination conditions within the inspection system.

LED/OLED Organic Chemical Sample Inspection

The optical system can be applied to the inspection of LED/OLED organic chemical samples, providing an imaging platform for sample observation and inspection processes.

Bio & Semiconductor Applications

In addition to LED/OLED applications, the system is designed for bio and semiconductor sample inspection, allowing the optical configuration to be used across different research and industrial inspection environments.

Alignment Function

The system supports alignment applications, enabling sample positioning and optical observation to be incorporated into inspection processes requiring positional verification.

Surface Inspection

The optical configuration can also be used for surface inspection, providing image-based observation of target sample surfaces as part of quality inspection, research, or process evaluation.

System Configuration

The Fluorescent Microscope System supports various format configurations depending on the intended inspection environment and sample requirements.

Available configurations can be structured around:

• Fluorescent sample imaging
• Special wavelength illumination
• VIS wavelength illumination
• Simultaneous wavelength irradiation
• Positional information detection
• Alignment
• Surface inspection
• Bio sample inspection
• Semiconductor sample inspection
• LED/OLED organic chemical sample inspection

Exact dimensions, optical magnification, wavelength values, camera specifications, objective lens specifications, and power requirements were not provided and therefore are not stated.

Operation

The system is configured according to the target sample and required optical inspection method. The sample is positioned within the inspection area, and the appropriate illumination configuration is applied.

For fluorescent material-coated samples, the system captures the sample image and supports detection of positional information. Special wavelength and VIS wavelength illumination can be simultaneously applied where required. The acquired optical image can then be used for inspection processes including alignment and surface observation.

Applications

• Bio sample imaging and inspection
• Semiconductor sample inspection
• LED organic chemical sample inspection
• OLED organic chemical sample inspection
• Fluorescent material-coated sample imaging
• Fluorescent sample position detection
• Optical alignment
• Surface inspection
• Research imaging systems
• Industrial optical inspection

Product Advantages

• Designed for bio and semiconductor inspection
• Applicable to LED/OLED organic chemical samples
• Supports fluorescent material-coated sample imaging
• Detects positional information from fluorescent sample images
• Supports special wavelength illumination
• Supports VIS wavelength illumination
• Simultaneous special wavelength + VIS irradiation
• Supports alignment applications
• Supports surface inspection
• Various system format configurations available
• Configurable image optical system for research and industrial inspection