- MID
- 3755581
TEST Target 2
Request For Quotation
■For measuring the accuracy and performance of the image system
■DOT, Distortion, Reticles, Distance
■Various materials such as Glass, Ceramic, and Matal are available
■OEM production is possible
■Image optical system for precision measurement, alignment, surface inspection, etc. of semiconductor wafers
■DOT, Distortion, Reticles, Distance
■Various materials such as Glass, Ceramic, and Matal are available
■OEM production is possible
■Image optical system for precision measurement, alignment, surface inspection, etc. of semiconductor wafers
- Certification
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- Award
-
- Shipping
-
- Lead Time1 ~ 60days
- Type of Freight MM
- Modes of Transport Proceed after consultation
- Products Shipped From Cheongju
- Payment
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- Quantity
- MOQ : 1 EA
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