LDI-TOF is a technology that combines Laser Desorption/Ionization (LDI) with Time-of-Flight (TOF) mass spectrometry, offering significant potential for high-speed quality control in the semiconductor and display industries.

This system utilizes an ultra-fine laser (approximately 5μm spot size) and a proprietary optical system to directly analyze high-resolution OLED panels, such as QHD smartphone displays. Additionally, the mass imaging analysis system enables the visualization of spatial distribution, allowing for precise identification of the chemical composition of materials.

In particular, the integration of an ultra-fine laser and a high-precision stage provides high spatial resolution, enabling real-time detection of impurities and defects by analyzing the material composition of each RGB pixel. Moreover, its unique cloud-based operation ensures an optimal solution to meet qualification requirements in the manufacturing process.

The LDI-TOF technology supports high-resolution, non-contact analysis and can be widely applied in quality inspection, defect analysis, and impurity detection of semiconductor and display materials.