[Semiconductor Wafer Test Probe Card]

* Memory Application: NAND Flash, DRAM

* Non-memory Application: SoC (Vertical), CIS (MEMS), DDI, DC Parametric etc.

A probe card is an interface between an electronic test system and a semiconductor wafer. Its purpose is to provide an electrical pathway between a test system and the circuits in a wafer, thereby permitting the testing and validation of the circuits at the wafer level, usually before they are diced and packaged.